8-Channel Thermocouple Simulator
8-Channel RTD Simulator Board
The DNA-RTD-388, DNR-RTD-388 and DNF-RTD-388 boards are8-channel, RTD simulators designed for use in UEI’s popular Cube,RACKTangle and FLATRACK chassis respectively. The boards are basedon actual switched resistors and will precisely duplicate the behaviorof the RTDs simulated.
The boards are an ideal solution for simulator / SIL applications wherean on-board system device is expecting an RTD as an input. The boardsare also an excellent solution for testing and diagnosing errors in avariety of RTD based systems.
The boards are available in two configurations. The DNx-RTD-388series simulates a 1000 Ω RTD while the standard DNx-RTD-388-100simulates the 100 Ω RTD. Other resistance values are available on aspecial order basis.
The DNx-RTD-388 series is part of UEI’s powerful Guardian series andprovides powerful diagnostic readback functionality. A/D converterson each channel allow the application to monitor input current. Theboard also provides simulation of open and short-circuited RTDs.
All connections are made through a convenient 37-pin D connectorensuring OEMs may easily obtain mating cables or connectors. Usersmay also connect the DNx-RTD-388 series boards to our popular DNA-STP-37 screw terminal panel via the DNA-CBL-37S series cables. Thecables are fully shielded and are available in 3, 10 and 20 foot lengths.
The DNx-RTD-388 series includes software drivers supporting allpopular operating systems including: Windows, Linux, QNX, VXWorks,and most other popular Real-Time Operating Systems. Windowsusers may take advantage of the powerful UEIDAQ Framework whichprovides a simple and complete software interface to all popularWindows programming language and data acquisition and controlapplications (e.g. LabVIEW, MATLAB).
UEI's Guardian Series brings system monitoring to a whole new level.
In this Master Class, UEI application engineer Austyn Turner walks through our sophisticated and reliable on-board monitoring diagnostics we call “Guardian”, also known as "Built-In-Test" or BIT.